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Designers Guide to Testable Asic Devices
Designers Guide to Testable Asic Devices by Wayne M. Needham 0442002211 9780442002213
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ISBN: 0442002211


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While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o

Author: Wayne M. Needham

Language: English

Binding: Hardcover

Pages: 284

Publisher: Springer

Publication Date: 1991-01-10


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